Ключевые слова: chalcogenide, FeSe, wires, doping effect, fabrication, sintering, PIT process, ex-situ process, X-ray diffraction, microstructure, resistivity, temperature dependence, resistive transition, magnetic field dependence, upper critical fields, critical caracteristics, current-voltage characteristics, experimental results
Ключевые слова: HTS, REBCO, coated conductors, critical caracteristics, critical current density, angular dependence, pinning, high field tests, mechanical properties, strain effects, upper critical fields, critical current, temperature dependence, magnetic field dependence, n-value, pinning force, numerical analysis, irreversibility fields, experimental results, comparison, LTS
Senatore C., Bordini B., Verweij A., Siemko A., Bernhard A., Will A., Schmidt R., Wollmann D., Bonura M., Mentink M., Mueller A.-S., Oslandsbotn A., Schubert J.
Ключевые слова: proton irradiation, irradiation effects, cryogenic systems, pulsed operation, LTS, NbTi, Nb3Sn, strands, mechanical properties, strain effects, transport currents, magnetic field dependence, RRR parameter, degradation studies, minimum quench energy, pinning force, upper critical fields, experimental results, numerical analysis, comparison
Pantsyrny V.I., Sergeev V.V., Abdyukhanov I.M., Polikarpova M.V., Novosilova D.S., Lukyanov P.A., Guryev V.V., Alekseev M.V., Tsapleva A.S., Bazaleeva K.O., Silaev A.G.
Malagoli A., Ferdeghini C., Mancini A., Vannozzi A., Celentano G., Braccini V., Putti M., Manfrinetti P., Pallecchi I., Bernini C., Bellingeri E., Leveratto A., Sylva G., Lisitskiy M., Manca N., Provino A.
Ключевые слова: chalcogenide, FeSeTe, coated conductors, buffer layers, texture, thickness dependence, RABITS process, substrate Hastelloy, substrate Ni-W, X-ray diffraction, microstructure, resistive transition, magnetic field dependence, critical caracteristics, Jc/B curves, critical temperature, upper critical fields
Ключевые слова: magnetic field density, temperature dependence, phase diagram, upper critical fields, angular dependence
Chaud X., Senatore C., Giannini E., Buta F., Leboeuf D., Bonura M., Matera D., Cerny R., Walker S.M.
Eisterer M., Goldacker W., Prikhna T.A., Moshchil V.E., Rindfleisch M., Hellstrom E.E., Li C., Kozyrev A., Shapovalov A.P., Tompsic M., Yang F., Grechnev G.E., Zhang V.S., Romaka V.V.
Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical caracteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, lattice parameter, Jc/B curves, experimental results
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